Lithography
LP3000 Direct-Write Lithography System
Laser direct writing for photomasks, wafers and microfabrication applications.
View productProduct catalogue
Equipment for your next process.
Explore lithography, wafer inspection, optical metrology and automation systems. Select a product to review reference specifications and enquire.
Lithography
WEM2000 Maskless Wafer Writer
Maskless exposure for research, prototyping and small-batch wafer processing.
View product
Lithography
GA100 Manual Mask Aligner
Manual contact lithography with UV LED illumination for small substrates.
View product
Lithography
CI-150 / CI-200 Automatic Mask Aligners
Automatic mask alignment and exposure for 150 mm and 200 mm wafers.
View product
Wafer inspection
NOVA-2000 SiC Wafer Inspection
Optical defect inspection for polished and epitaxial silicon carbide wafers.
View product
Wafer inspection
NOVA-2000-LN/LT Wafer Inspection
Defect inspection for lithium niobate and lithium tantalate substrates.
View product
Wafer inspection
NOVA-2000-G Glass Wafer Inspection
Optical defect inspection for glass wafers.
View product
Wafer inspection
AMMI-2000 Patterned Wafer Inspection
Patterned wafer inspection using bright-field, dark-field and differential interference imaging.
View product
Wafer inspection
MSDI-2000 Unpatterned Wafer Inspection
Optical wafer defect inspection. Specify wafer material, diameter and target defect size.
View productWafer inspection
MSDI-3000 Unpatterned Wafer Inspection
Optical wafer defect inspection. Specify wafer material, diameter and target defect size.
View productWafer inspection
MSDI-5000 Unpatterned Wafer Inspection
Optical wafer defect inspection. Specify wafer material, diameter and target defect size.
View product
Optical inspection
AOSI-4000S Automated Lens Defect Inspection
Automated surface defect inspection for precision optical lenses.
View product
Optical inspection
AOSI-4000F Flat Optical Element Inspection
Surface defect inspection for flat optical elements.
View product
Optical inspection
AOSI-4000S-P Prism Inspection
Automated surface defect inspection for optical prisms.
View product
Optical inspection
LCM-2000 Laser Confocal Microscope
Non-contact confocal measurement of microstructure and surface topography.
View product
Optical inspection
PTS-2000 / PTB-2000 Optical Absorption Measurement
Photothermal measurement of weak optical absorption in substrates and coatings.
View product
Optical inspection
PTS-DUV-2000 / PTB-DUV-2000 Deep-UV Absorption Measurement
Deep-ultraviolet optical absorption measurement for precision optical materials.
View product
Optical inspection
LC-2000 / LC-DUV-2000 Laser Calorimetry
Laser calorimetry for optical absorption characterization.
View product
Optical inspection
LDT-2000-C Laser Damage Testing
Laser damage threshold testing and conditioning for optical materials and coatings.
View product
Optical inspection
MMDI-2000 Multimodal Surface Defect Inspection
Multimodal inspection of surface defects in precision optical components.
View product
Optical inspection
SSDI-2000 Subsurface Defect Inspection
Surface and subsurface defect inspection for optical materials.
View product
Optical inspection
PTM-2000-LA Large-Aperture Absorption Defect Inspection
Large-aperture photothermal inspection of optical absorption defects.
View product
Optical inspection
LSDI-2000-LA / LSDI-3000-C Scattering Inspection
Optical scattering inspection for large-aperture components.
View product
Optical inspection
MMDI-2000-LA Large-Aperture Multimodal Inspection
Large-aperture multimodal optical defect inspection.
View product
Optical inspection
HTR-2000-LA Transmittance / Reflectance Measurement
Transmittance and reflectance measurement for large-aperture optical components.
View product
Metrology
Thin-Film Stress Tester
Measure thin-film stress on wafers from 100 mm to 300 mm.
View product
Wafer handling
6–12 Inch Wafer Sorter
Configurable wafer handling with OCR, alignment and double-sided identification.
View productWafer handling
Wafer Robots and Load Ports
Wafer-transfer modules and related equipment support.
View product
Reticle handling
GM200A Automatic Reticle Pod Opener
Automatic opening of SMIF reticle pods with selectable RSP150 or RSP200 configuration.
View product
Reticle handling
GM200M Manual Reticle Pod Opener
Manual SMIF reticle pod opening without an electrical supply.
View product
Reticle handling
F / I / Y Reticle Grippers
F, I and Y reticle grippers for controlled mask handling.
View product
Process equipment
FEOL Laser Annealing
Laser Annealing for semiconductor and advanced packaging applications.
View product
Process equipment
Power Device Laser Annealing
Device Laser Annealing for semiconductor and advanced packaging applications.
View product
Process equipment
Overlay Metrology
Metrology for semiconductor and advanced packaging applications.
View product
Process equipment
WLP Stepper
Stepper for semiconductor and advanced packaging applications.
View product
Process equipment
PLP Stepper
Stepper for semiconductor and advanced packaging applications.
View product
Process equipment
Advanced Packaging AOI
Packaging AOI for semiconductor and advanced packaging applications.
View product
Process equipment
SWA / SWB Wafer Aligner and Bonder
/ SWB Wafer Aligner and Bonder for semiconductor and advanced packaging applications.
View product
Process equipment
LED Stepper
Stepper for semiconductor and advanced packaging applications.
View product
Process equipment
Compound Semiconductor Stepper
Manufacturer-stated development platform for compound semiconductor lithography. Confirm current product maturity and configuration.
View product
Process equipment
SiC Laser Annealing
Laser Annealing for semiconductor and advanced packaging applications.
View product
Process equipment
FPD Scanner
Lithography scanner for LCD and AMOLED flat-panel display manufacturing.
View product
Process equipment
TP / CD Measurement
Pattern and critical-dimension measurement for display manufacturing.
View product
Process equipment
Photo Alignment Equipment
Photoalignment equipment for IPS TFT-LCD processing.
View product
Process equipment
FMM Tension Equipment
Fine-metal-mask tension equipment for AMOLED mask preparation.
View product
Process equipment
Temperature Control Units
Control Units for semiconductor and advanced packaging applications.
View product
Refurbished equipment
MA / EVG Series Refurbished Mask Aligners
Refurbished mask aligner sourcing and equipment support.
View product
Refurbished equipment
Pegasus / MultiPlex Plasma Etch Systems
Remanufactured equipment family listed in the company portfolio.
View product
Refurbished equipment
S8 / S9 / CG Series Scanning Electron Microscopes
Remanufactured equipment family listed in the company portfolio.
View product
Refurbished equipment
SFS / SP Series Wafer Inspection
Remanufactured equipment family listed in the company portfolio.
View product
Refurbished equipment
Archer / RS Series Overlay and Metrology
Remanufactured equipment family listed in the company portfolio.
View product
Refurbished equipment
IPRO Series Metrology Systems
Remanufactured equipment family listed in the company portfolio.
View product
Refurbished equipment
Escan Series Wafer Inspection
Remanufactured equipment family listed in the company portfolio.
View productLaser processing
YG200 Laser Cutting / Etching System
Laser cutting and etching system named in the September 2025 portfolio.
View productNo matching products.
Try another model or keyword, or ask our team for sourcing support.
Contact our team ↗Products are offered subject to configuration and availability confirmation. Refurbished equipment listings describe sourcing capabilities, not guaranteed current stock.